Quantum Dots Microstructural Metrology: From Time-Resolved Spectroscopy to Spatially Resolved Electron Microscopy

Colloidal quantum dots (QDs) have unique optical and electrical properties with promising applications in next-generation semiconductor technologies, including displays, lighting, solar cells, photodetectors, and image sensors. Advanced analytical tools to probe the optical, morphological, structural, compositional, and electrical properties of QDs and their ensemble solid films are of paramount importance for the understanding of their device performance. In this review, comprehensive studies on the state-of-the-art metrology approaches used in QD research are introduced, with particular focus on time-resolved (TR) and spatially resolved (SR) spectroscopy and microscopy. Through discussing these analysis techniques in different QD system, such as various compositions, sizes, and shell structures, the critical roles of these TR-spectroscopic and SR-microscopic techniques are highlighted, which provide the structural, morphological, compositional, optical, and electrical information to precisely design QDs and QD solid films. The employment of TR and SR analysis in integrated QD device systems is also discussed, which can offer detailed microstructural information for achieving high performance in specific applications. In the end, the current limitations of these analytical tools are discussed, and the future development of the possibility of interdisciplinary research in both QD fundamental and applied fields is prospected.     

单晶硅晶格间距的测量技术进展及应用

单晶硅晶格间距是许多重要物理常数测量的基础。本文介绍了硅晶格间距测量技术的发展历程,包括X射线干涉仪直接测量和晶格比较仪间接测量两种方法,以及影响测量结果不确定度的关键因素。得益于晶格间距测量的进展,在纳米尺度,硅晶格间距被国际计量局(BIPM)批准成为新的米定义复现形式。最后介绍了硅晶格在计量学中的应用,以及基于硅晶格实现纳米几何量测量的溯源体系的研究趋势。     

Criticality-based quantum metrology in the presence of decoherence

Because quantum critical systems are very sensitive to the variation of parameters around the quantum phase transition (QPT), quantum criticality has been presented as an efficient resource for metrology. In this paper, we address the issue whether the divergent feature of the inverted variance is realizable in the presence of noise when approaching the QPT. Taking the quantum Rabi model (QRM) as an example, we obtain the analytical result for the inverted variance with single-photon relaxation. We show that the inverted variance may be convergent in time due to the noise. Since the precision of the metrology is very sensitive to the noise, as a remedy, we propose squeezing the initial state to improve the precision under decoherence. In addition, we also investigate the criticality-based metrology under the influence of the two-photon relaxation. Strikingly, although the maximum inverted variance still manifests a power-law dependence on the energy gap, the exponent is positive and depends on the dimensionless coupling strength. This observation implies that the criticality may not enhance but weaken the precision in the presence of two-photon relaxation, due to the non-linearity introduced by the two-photon relaxation.     

The Surface Analysis Working Group at the Consultative Committee for Amount of Substance,Metrology in Chemistry and Biology: A successful initiative by Martin Seah

Dr Martin Seah, NPL, was the initiator, founder, and first chairman of the Surface Analysis Working Group (SAWG) at the Consultative Committee for Amount of Substance, Metrology in Chemistry and Biology (CCQM) at the Bureau International des Poids et Mesures (BIPM), the international organization established by the Metre Convention. This tribute letter summarizes his achievements during his chairmanship and his long-running impact on the successful work of the group after his retirement.     

A two-point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects

Quantification of the composition of binary mixtures in secondary ion mass spectrometry (SIMS) is required in the analyses of technological materials from organic electronics to drug delivery systems. In some instances, it is found that there is a linear dependence between the composition, expressed as a ratio of component volumes, and the secondary ion intensities, expressed as a ratio of intensities of ions from each component. However, this ideal relationship fails in the presence of matrix effects and linearity is observed only over small compositional ranges, particularly in the dilute limits. In this paper, we assess an empirical method, which introduces a power law dependence between the intensity ratio and the volume fraction ratio. A previously published physical model of the organic matrix effect is employed to test the limits of the method and a mixed system of 3,3′-bis(9-carbazolyl) biphenyl and tris(2-phenylpyridinato)iridium (III) is used to demonstrate the method. This paper introduces a two-point calibration, which determines both the exponent in the power law and the sensitivity factor for the conversion of ion intensity ratio into volume fraction ratio. We demonstrate that this provides significantly improved accuracy, compared with a one-point calibration, over a wide compositional range in SIMS quantification and with a weak dependence on matrix effects. Because the method enables the use of clearly identifiable secondary ions for quantitative purposes and mitigates commonly observed matrix effects in organic materials, the two-point calibration method could be of significant benefit to SIMS analysts.     

激光散斑干涉法测量金属复合引线热膨胀系数的实验研究

本文采用激光散斑干涉法测量微电子金属封装用金属复合引线的热膨胀系数。该方法有很高的测量精度和灵敏度,并对试件形状、尺寸和表面无特殊要求。同时利用光学方法全场测量的优点,使用已知热膨胀系数的金属材料作为标准试件,可减少温度场不均匀分布及微小变化对测试精度的影响,消除了测量光路几何参数导致的系统误差。在相对简单的实验设备下,得到较高精度金属复合引线的热膨胀系数值。该方法可广泛用于各种新材料的热膨胀系数的测定。     

一种新的数字散斑相关方法及其应用

本文提出了一种新的改进的数字散斑相关方法——十字搜索法。采用该方法将大大缩短计算时间，从而使数字散斑相关在微机上得到成功的应用。本文还从概率与统计的角度提出了新的相关系数计算公式，这个计算公式可以提高计算精度。文中还讨论了高精度测量的一些技术问题。初步实验验证表明，本文所提出的方法是一种实用的快速、高精度的位移、应变测试方法。     

双参考光全息—散斑干涉术的原理和实验

本文用统计光学方法对双参考光全息——散斑干涉术进行了详尽的理论分析,给出了全息和散斑干涉场区域平均光强分布与光学系统主要参数及三维变形场各分量之间关系的解析表达式,进而讨论了离面位移和面内位移测量的上、下限,最后还给出了有关的实验结果。     

用曲线大窗口平滑散斑条纹图的方法研究

提出一种计算条纹方向的简单算法,以及通过条纹方向图获得沿条纹方向的曲线窗口并对散斑条纹图进行曲线大窗口滤波的方法．实验表明此方法较好地消除了散斑条纹图的噪声,同时尽量减小了对条纹结构的损害．为从单幅散斑条纹图中应用条纹中心线法或全灰度法进一步提取相位场的后处理,奠定了良好的基础．     

数字散斑相关方法的原理与应用

应用图像识别与变分学原理，对数字散斑相关方法作了理论阐述，导出了测量物体表面变形场的一般过程，将力学中的变形测量问题转化为单纯的数值计算问题，避免了传统光测方法与干涉条纹有关的一系列困难。初步的实验结果表明，该方法在工程实际现场、高速冲击动态过程、细观力学变形过程以及变形测量的自动化等方面都有广泛的应用潜力，从而为光测力学拓展应用领域、实现自动化测量展现了新的前景．